3

Dimensional metrology at the National Bureau of Standards

Year:
1983
Language:
english
File:
PDF, 1.15 MB
english, 1983
8

The long-range scanning stage: a novel platform for scanned-probe microscopy

Year:
2000
Language:
english
File:
PDF, 1.94 MB
english, 2000
9

Engineering Nanotechnology: The Top Down Approach

Year:
2008
Language:
english
File:
PDF, 752 KB
english, 2008
11

Critical-point universality and fluids

Year:
1977
Language:
english
File:
PDF, 2.06 MB
english, 1977
20

Construction and testing of a nanomachining instrument

Year:
2000
Language:
english
File:
PDF, 905 KB
english, 2000